image processing package digitalmicrograph software (Gatan Inc)
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Gatan Inc
image processing package digitalmicrograph software
Image Processing Package Digitalmicrograph Software, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 97/100, based on 12074 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/image+processing+package+digitalmicrograph+software/DigitalMicrograph+Software/10__1007_slash_s10338___018___0021___y-99-24-29
Average 97 stars, based on 12074 article reviews
Image Processing Package Digitalmicrograph Software, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 97/100, based on 12074 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/image+processing+package+digitalmicrograph+software/DigitalMicrograph+Software/10__1007_slash_s10338___018___0021___y-99-24-29
Average 97 stars, based on 12074 article reviews
image processing package digitalmicrograph software - by Bioz Stars,
2026-10
97/100 stars
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Related Articles
Software:Article Title: In-situ SEM investigation of sub-microscale deformation fields around a crack-tip in silicon Article Snippet: A combination of in-situ scanning electron microscopy (SEM) and geometric phase analysis (GPA) was used to study the deformation fields around a crack-tip in single-crystal silicon under uniaxial tensile load.. The sub-microscale silicon pillars grating was fabricated using holographic lithography followed by inductively coupled plasma etching.. A series of SEM images of dynamic crack with the submicroscale grating were obtained during tensile testing. Article Title: Mapping Microscale Strain Fields Around a Crack Tip in Molybdenum Via Geometric Phase Analysis and Digital Image Correlation Article Snippet: Uniaxial tension tests were conducted on single-edge-notched tensile specimens of pure molybdenum with a mesh grid pattern in front of the notch.. A series of images of crack initialization and propagation with a distorted mesh grid pattern were obtained by means of in situ scanning electron microscopy.. Strain fields around the crack tip were mapped successively using geometric phase analysis and digital image correlation techniques, and then compared with the predictions obtained through linear elastic fracture mechanics (LEFM). |